Revealing the local crystallinity of single silicon core–shell nanowires using tip-enhanced Raman spectroscopy

• Marius van den Berg,
• Ardeshir Moeinian,
• Arne Kobald,
• Yu-Ting Chen,
• Anke Horneber,
• Steffen Strehle,
• Alfred J. Meixner and
• Dai Zhang

Beilstein J. Nanotechnol. 2020, 11, 1147–1156, doi:10.3762/bjnano.11.99

• , Germany 10.3762/bjnano.11.99 Abstract Tip-enhanced Raman spectroscopy is combined with polarization angle-resolved spectroscopy to investigate the nanometer-scale structural properties of core–shell silicon nanowires (crystalline Si core and amorphous Si shell), which were synthesized by platinum

• local structural properties of Si nanomaterials at the sub-10 nanometer scale using tip-enhanced Raman techniques. Keywords: core–shell nanowires; local crystallinity; polarization angle-resolved spectroscopy; silicon; tip-enhanced Raman spectroscopy; Introduction The properties of silicon are long

• nanocrystalline, depending on the synthesis parameters. Hence, these nanowires resemble ideal objects to study local crystallinity variations at the sub-10 nanometer scale using TERS. Furthermore, polarization angle-resolved spectroscopy is for the first time combined with TERS, in order to reveal the different